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1

Toward a theoretical framework of service experience: perspectives from customer expectation and customer emotion

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Journal:

Total Quality Management & Business Excellence

Year:

2019

Language:

english

File:

PDF, 700 KB

english, 2019

2

An innovative approach to measuring technology spillovers in service-dominant logic

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Journal:

Year:

2015

Language:

english

File:

PDF, 1.26 MB

english, 2015

3

Modeling dynamic service recovery strategies: a signaling game approach

Hsieh, Yen-Hao, Yeh, Shu-Yu

Journal:

Year:

2018

Language:

english

File:

PDF, 285 KB

english, 2018

4

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - A highly scalable 8-layer Vertical Gate 3D NAND with split-page bit line layout and efficient binary-sum MiLC (Minimal Incremental Layer Cost) staircase contacts

Chen, Shih-Hung, Lue, Hang-Ting, Shih, Yen-Hao, Chen, Chieh-Fang, Hsu, Tzu-Hsuan, Chen, Yan-Ru, Hsiao, Yi-Hsuan, Huang, Shih-Cheng, Chang, Kuo-Pin, Hsieh, Chih-Chang, Lee, Guan-Ru, Chuang, Alfred-Tung

Year:

2012

Language:

english

File:

PDF, 2.43 MB

english, 2012

5

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Memory Architecture of 3D Vertical Gate (3DVG) NAND Flash Using Plural Island-Gate SSL Decoding Method and Study of it's Program Inhibit Characteristics

Kuo-Pin Chang,, Hang-Ting Lue,, Chih-Ping Chen,, Chieh-Fang Chen,, Yan-Ru Chen,, Yi-Hsuan Hsiao,, Chih-Chang Hsieh,, Yen-Hao Shih,, Tahone Yang,, Kuang-Chao Chen,, Chun-Hsiung Hung,, Chih-Y

Year:

2012

Language:

english

File:

PDF, 549 KB

english, 2012

6

Improved Reliability Performances of SONOS-Type Devices Using Hot-Hole Erase Method by Novel Negative FN Operations

Yi-Hsuan Hsiao,, Hang-Ting Lue,, Yen-Hao Shih,, Erh-Kun Lai,, Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2008

Language:

english

File:

PDF, 822 KB

english, 2008

7

Z-Interference and Z-Disturbance in Vertical Gate-Type 3-D NAND

Yeh, Teng-Hao Elton, Chen, Wei-Chen, Hsu, Tzu-Hsuan Bruce, Du, Pei-Ying Penny, Hsieh, Chih-Chang, Lue, Hang-Ting, Shih, Yen-Hao, King, Ya-Chin, Lu, Chih-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 3.14 MB

english, 2016

8

A PSO-based intelligent service dispatching mechanism for customer expectation management

Yen-Hao Hsieh, Soe-Tsyr Yuan, Ruei-Lin Kuo

Journal:

Expert Systems with Applications

Year:

2011

Language:

english

File:

PDF, 1.59 MB

english, 2011

9

Modeling and Characterization of Hydrogen-Induced Charge Loss in Nitride-Trapping Memory

Yi-Lin Yang, Chia-Hua Chang, Yen-Hao Shih, Kuang-Yeu Hsieh, Jenn-Gwo Hwu

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 431 KB

english, 2007

10

Fluorinated thienyl-quinoxaline-based D–π–A-type copolymer toward efficient polymer solar cells: synthesis, characterization, and photovoltaic properties

Chen, Hsieh-Chih, Chen, Ying-Hsiao, Liu, Chung-Hao, Hsu, Yen-Hao, Chien, Yun-Chen, Chuang, Wei-Ti, Cheng, Chih-Yang, Liu, Chien-Liang, Chou, Shang-Wei, Tung, Shih-Huang, Chou, Pi-Tai

Journal:

Polymer Chemistry

Year:

2013

Language:

english

File:

PDF, 487 KB

english, 2013

11

FCM-based customer expectation-driven service dispatch system

Yen-Hao Hsieh, I-Hsuan Chen, Soe-Tsyr Yuan

Journal:

Soft Computing - A Fusion of Foundations, Methodologies and Applications

Year:

2014

Language:

english

File:

PDF, 1.15 MB

english, 2014

12

Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory Devices

Hsiao, Yi-Hsuan, Lue, Hang-Ting, Chen, Wei-Chen, Chang, Kuo-Pin, Shih, Yen-Hao, Tsui, Bing-Yue, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.66 MB

english, 2014

13

5-Aminolevulinic acid induced photodynamic inactivation on Staphylococcus aureus and Pseudomonas aeruginosa

Hsieh, Chien-Ming, Huang, Yen-Hao, Chen, Chueh-Pin, Hsieh, Bo-Chuan, Tsai, Tsuimin

Journal:

Journal of Food and Drug Analysis

Year:

2014

Language:

english

File:

PDF, 889 KB

english, 2014

14

Expectation-based coopetition approach to service experience design

Hsieh, Yen-Hao, Lin, Yu-Ting, Yuan, Soe-Tsyr

Journal:

Simulation Modelling Practice and Theory

Year:

2013

Language:

english

File:

PDF, 2.38 MB

english, 2013

15

Service interaction design: A Hawk-Dove game based approach to managing customer expectations for oligopoly service providers

Yen-Hao Hsieh,Soe-Tsyr Yuan,Hsiao-Chen Liu

Journal:

Information Systems Frontiers

Year:

2014

Language:

english

File:

PDF, 941 KB

english, 2014

16

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Study of localized tunnel oxide degradation after hot carrier stressing using a novel mid-bandgap voltage characterization method

Tsai, Cheng-Hung, Shih, Yen-Hao, Hsiao, Yi-Hsuan, Hsu, Tzu-Hsuan, Hsieh, Kuang Yeu, Liu, Rich, Lu, Chih-Yuan

Year:

2009

Language:

english

File:

PDF, 511 KB

english, 2009

17

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Radically extending the cycling endurance of Flash memory (to > 100M Cycles) by using built-in thermal annealing to self-heal the stress-induced damage

Lue, Hang-Ting, Du, Pei-Ying, Chen, Chih-Ping, Chen, Wei-Chen, Hsieh, Chih-Chang, Hsiao, Yi-Hsuan, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.41 MB

english, 2012

18

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Novel soft erase and re-fill methods for a P/sup +/-poly gate nitride trapping non-volatile memory device with excellent endurance and retention properties

Hang-Ting Lue,, Yen-Hao Shih,, Kuang Yen Hsieh,, Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 1.17 MB

english, 2005

19

[IEEE 2011 International Joint Conference on Service Sciences (IJCSS) - Taipei, Taiwan (2011.05.25-2011.05.27)] 2011 International Joint Conference on Service Sciences - Evaluating a Mechanism for Measuring Customer Expectation in Real-Time Service Contexts

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Year:

2011

Language:

english

File:

PDF, 347 KB

english, 2011

20

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - The application of e beam inspection on 3D NAND flash

Liao, Hsiang-Chou, Chen, Yi-Chin, Lee, Guan-Ru, Shih, Yen-Hao, Lue, Hang-Ting, Luoh, Tuung, Yang, Ling-Wu, Hsieh, Kuang-Yeu, Yang, Tahone, Chen, Kuang-Chao, Liu, Rich, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 306 KB

english, 2012

21

[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - Study of hot-electron assisted programming for split-page 3D vertical gate (VG) NAND flash

Chang, Kuo-Pin, Lue, Hang-Ting, Chang, Chih-Shen, Yeh, Wen-Wei, Hsieh, Chih-Chang, Hsiao, Yi-Hsuan, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2013

Language:

english

File:

PDF, 821 KB

english, 2013

22

[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Overview of 3D NAND Flash and progress of vertical gate (VG) architecture

Lue, Hang-Ting, Chen, Shih-Hung, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.47 MB

english, 2012

23

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Study of Charge Loss Mechanism of SONOS-Type Devices using Hot-Hole Erase and Methods to Improve the Charge Retention

Lue, Hang-ting, Hsiao, Yi-hsuan, Shih, Yen-hao, Lai, Erh-kun, Hsieh, Kuang-yeu, Liu, Rich, Lu, Chih-yuan

Year:

2006

Language:

english

File:

PDF, 297 KB

english, 2006

24

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - A highly pitch scalable 3D vertical gate (VG) NAND flash decoded by a novel self-aligned independently controlled double gate (IDG) string select transistor (SSL)

Chen, Chih-Ping, Lue, Hang-Ting, Chang, Kuo-Pin, Hsiao, Yi-Hsuan, Hsieh, Chih-Chang, Chen, Shih-Hung, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.23 MB

english, 2012

25

[IEEE 2011 Eighth International Conference on Information Technology: New Generations (ITNG) - Las Vegas, NV, USA (2011.04.11-2011.04.13)] 2011 Eighth International Conference on Information Technology: New Generations - A System Dynamics Approach for Modeling Service Recovery

Year:

2011

Language:

english

File:

PDF, 216 KB

english, 2011

26

[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Study of the programming sequence induced back-pattern effect in split-page 3D vertical-gate (VG) NAND flash

Wei-Chen Chen,, Lue, Hang-Ting, Kuo-Pin Chang,, Yi-Hsuan Hsiao,, Hsieh, Chih-Chang, Yen-Hao Shih,, Chih-Yuan Lu,

Year:

2014

Language:

english

File:

PDF, 611 KB

english, 2014

27

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Highly reliable 2-bit/cell nitride trapping flash memory using a novel array-nitride-sealing (ANS) ONO process

Yen-Hao Shih,, Lee, S.C., Lue, H.T., Wu, M.D., Hsu, T.H., Lai, E.K., Hsieh, J.Y., Wu, C.W., Yang, L.W., Kuang Yeu Hsieh,, Chen, K.C., Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 736 KB

english, 2005

28

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability

Hang-Ting Lue,, Szu-Yu Wang,, Erh-Kun Lai,, Yen-Hao Shih,, Sheng-Chih Lai,, Ling-Wu Yang,, Kuang-Chao Chen,, Ku, J., Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 393 KB

english, 2005

29

[IEEE 2010 43rd Hawaii International Conference on System Sciences - Honolulu, Hawaii, USA (2010.01.5-2010.01.8)] 2010 43rd Hawaii International Conference on System Sciences - A S-D Logic Based Approach to Input-Output Analysis for Technology Spillover

Hsieh, Yen-Hao, Yuan, Soe-Tysr

Year:

2010

Language:

english

File:

PDF, 352 KB

english, 2010

30

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - A novel double-trapping BE-SONOS charge-trapping NAND flash device to overcome the erase saturation without using curvature-induced field enhancement effect or high-K (HK)/metal gate (MG) materials

Lue, Hang-Ting, Roger Lo,, Chih-Chang Hsieh,, Pei-Ying Du,, Chen, Chih-Ping, Tzu-Hsuan Hsu,, Kuo-Ping Chang,, Yen-Hao Shih,, Chih-Yuan Lu,

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

31

[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Overview of 3D NAND Flash and progress of split-page 3D vertical gate (3DVG) NAND architecture

Du, Pei-Ying, Lue, Hang-Ting, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2014

Language:

english

File:

PDF, 2.73 MB

english, 2014

32

Call for Papers— Service Science Special Issue on Service Mining: Market, Technology, and Application

Chang, Wei-Lun, Hsieh, Yen-Hao

Journal:

Service Science

Year:

2012

Language:

english

File:

PDF, 133 KB

english, 2012

33

[ACM Press the 11th International Conference - Taipei, Taiwan (2009.08.12-2009.08.15)] Proceedings of the 11th International Conference on Electronic Commerce - ICEC '09 - A quantitative approach to measure customer expectation for service innovation within service experience delivery

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Year:

2009

Language:

english

File:

PDF, 488 KB

english, 2009

34

Interplay of Molecular Orientation, Film Formation, and Optoelectronic Properties on Isoindigo- and Thienoisoindigo-Based Copolymers for OFET and OPV Applications

Lu, Chien, Chen, Hsieh-Chih, Chuang, Wei-Ti, Hsu, Yen-Hao, Chen, Wen-Chang, Chou, Pi-Tai

Journal:

Chemistry of Materials

Year:

2015

Language:

english

File:

PDF, 4.18 MB

english, 2015

35

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance

Lo, Roger, Du, Pei-Ying, Hsu, Tzu-Hsuan, Wu, Chen-Jun, Guo, Jung-Yi, Cheng, Chun-Min, Lue, Hang-Ting, Shih, Yen-Hao, Hou, Tuo-Hung, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2015

Language:

english

File:

PDF, 441 KB

english, 2015

36

Can Customer Expectations be Measured in Real Time?

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Journal:

International Journal of Information Technology & Decision Making

Year:

2016

Language:

english

File:

PDF, 705 KB

english, 2016

37

[ACM Press the 18th Annual International Conference - Suwon, Republic of Korea (2016.08.17-2016.08.19)] Proceedings of the 18th Annual International Conference on Electronic Commerce e-Commerce in Smart connected World - ICEC '16 - Using a Markov-switching approach to modelling value co-creation

Hsieh, Yen-Hao, Chen, Wei-Ting

Year:

2016

Language:

english

File:

PDF, 1.15 MB

english, 2016

38

An application of technology-based design for exhibition services

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Journal:

International Journal of Quality and Service Sciences

Year:

2016

Language:

english

File:

PDF, 273 KB

english, 2016

39

Measuring the value variation of a service system: a Markov-switching model estimation

Hsieh, Yen-Hao, Chen, Wei-Ting, Johnston, WesleyJ, Johnston, WesleyJ

Journal:

Journal of Business & Industrial Marketing

Year:

2017

Language:

english

File:

PDF, 666 KB

english, 2017

40

Modeling the impact of service innovation for small and medium enterprises: A system dynamics approach

Hsieh, Yen-Hao, Chou, Yun-Hsuan

Journal:

Simulation Modelling Practice and Theory

Year:

2018

Language:

english

File:

PDF, 1.64 MB

english, 2018

41

Co-Targeting Prostate Cancer Epithelium and Bone Stroma by Human Osteonectin-Promoter–Mediated Suicide Gene Therapy Effectively Inhibits Androgen-Independent Prostate Cancer Growth

Sung, Shian-Ying, Chang, Junn-Liang, Chen, Kuan-Chou, Yeh, Shauh-Der, Liu, Yun-Ru, Su, Yen-Hao, Hsueh, Chia-Yen, Chung, Leland W. K., Hsieh, Chia-Ling, Culig, Zoran

Journal:

Year:

2016

Language:

english

File:

PDF, 1.24 MB

english, 2016

42

Effects of Rare Earth Metals on Steel Microstructures

Pan, Fei, Zhang, Jian, Chen, Hao-Long, Su, Yen-Hsun, Kuo, Chia-Liang, Su, Yen-Hao, Chen, Shin-Hau, Lin, Kuan-Ju, Hsieh, Ping-Hung, Hwang, Weng-Sing

Journal:

Year:

2016

Language:

english

File:

PDF, 9.37 MB

english, 2016

43

Evaluation of key factors for service experience: A comparison of tourism factories and international tourism hotels

Hsieh, Yen-Hao, Chuang, I-Chun

Journal:

Tourism Economics

Year:

2019

Language:

english

File:

PDF, 431 KB

english, 2019

44

A decision support system for service recovery in affective computing: an experimental investigation

Hsieh, Yen-Hao, Chen, Szu-Chieh

Journal:

Knowledge and Information Systems

Year:

2019

Language:

english

File:

PDF, 1.72 MB

english, 2019

45

Using System Dynamics to Analyze Customer Experience Design

Hsieh, Yen-Hao, Yuan, Soe-Tsyr

Journal:

International Journal of Service Science Management Engineering and Technology

Year:

2010

File:

PDF, 2.74 MB

2010